Park NX12 – Atomic Force Microscope

  • Atomic Force Microscopy (AFM) for nanometer resolution imaging with electrical, magnetic, thermal, and mechanical property measurement capabilities.
  • Pipette-based scanning system for high resolution Scanning Ion Conductance Microscopy (SICM), Scanning Electrochemical Microscopy (SECM), and Scanning Electrochemical Cell Microscopy (SECCM).
  • Inverted Optical Microscopy (IOM) for transparent material research and fluorescence microscopy integration.
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Description

Built with multi-user facilities in mind

Park NX12 was built from the ground up to accommodate the needs of multi-user facilities. Other AFM solutions lack the required versatility to address the diverse needs of users in these facilities, making it difficult to justify the equipment cost. The Park NX12, however, is built to accommodate standard ambient AFM, in-liquid SPM, and optical imaging making it one of the most flexible AFMs available.

 

A modular platform for shared user facilities

  The Park NX12 is an Atomic Force Microscopy platform specifically tailored to address the needs of analytical and electrochemistry researchers as well as those working in shared-use facilities.

It provides a versatile solution for SPM based characterization of chemical and electrochemical properties and surface characterization in both air and liquid media for a broad range of opaque and transparent materials.

The Park NX12 is easy to use for pipette-based SPM techniques with broad visual optical access to the scanning probe.

The Park NX12’s reasonable price and unparalleled accuracy make it the ideal platform for multi-user facilities as well as early-career researchers.

 

Multiple Applications

The Park NX12 can serve a wide range of functions, including PinPoint™ in-liquid and nanomechanical mapping, inverted optical microscopy to locate transparent samples, SICM for imaging ultra-soft samples, and enhanced vision to improve optics for transparent samples.

 

NX12-pinpointNX12-SICM

 

NX12-FD

Comprehensive force spectroscopy solution

The Park NX12 provides a complete package for nanomechanical characterization in liquid and in-air, making it ideal for a wide range of applications.

 

NX12-Modular

We make it easy to modify the Park NX12 to suit the unique needs of your lab by installing optional hardware and software add-ons even after installation.


Current-Distance(I-D) Spectroscopy

Acquiring the Current-Distance Curve of SICM on the way of pipette approach (vertical direction movement) toward sample surface is beneficial to elucidate various biological and chemical phenomena in an aqueous environment.

This beneficial application can be applied to a specific and interesting object of the sample, identified with SICM’s non-invasive topography. Furthermore, utilizing the ‘current-distance curve mapping’ function enables researchers to examine and acquire the current-distance curve at multiple positions so that they can reach a deeper level of understanding for biological and chemical reaction research.

SICM-i-d-spectroscopy

Park SmartScan™ makes scanning fast and simple

The Park NX12 is equipped with our SmartScan™ OS, making it one of the easiest-to-use AFMs in the market. With an intuitive but extremely powerful interface, even untrained users can quickly scan a sample without supervision. This lets senior researchers focus their experience on solving bigger problems and developing better solutions.

Easy-to-use

Shared labs often have users from a wide range of backgrounds and experience levels. The NX12 can accommodate every user with its simple point and click interface and automated SmartScan™ mode.

Here is how it works after you turn on the AFM system

smartscan-workflow

1. Click “Setup”

A small window appears that guides you through animation on how to set the instrument and place the sample for imaging. Typically this takes only a few minutes.

2. Click “Position”

The system automatically performs the frequency sweep for the cantilever, approaches the Z-stage to the sample, and autofocuses the sample allowing the user to see and navigate the area of interest for imaging.

3. Click “Image”

The system sets all the necessary parameters for optimum setting, then engages the cantilever and starts scanning the sample. It continues to scan until the image is acquired and completed.

End

The cantilever will disengage from the sample, and be ready for the next sample imaging.

Atomic Force Microscope Surface Analysis & Morphology

Electrochemistry cells

• Electrochemistry cell • Electrochemistry toolkit for universal liquid cell

  Electrochemistry options

• Potentiostat • Bipotentiostat

  Environmental Control Options

• Glovebox • Live-cell chamber

  Temperature Controlled Stages

• Temperature controlled stage (-25 ~180 ºC)

  Z Scanner Heads

• 15 μm Z Scanner AFM head • 30 μm Z Scanner AFM head • 15 μm Z Scanner SICM module • 30 μm Z Scanner SICM module

  In-Liquid Imaging Options

• Liquid probe hand • Open liquid cell • Universal liquid cell

  Acoustic Enclosure

• Stand alone type AE 204

  Clip-type Chip Carrier

• Can be used with an unmounted cantilever • Tip bias function available for conductive AFM and EFM • Tip bias range: -10 V ~ 10 V

  Starter kits for advanced modes

• Easy to use for advanced modes • Includes specialized probes and samples

Scanner

XY scanner range: 100 μm × 100 μm AFM head Z scanner range: 15 μm, (optional 30 μm) SICM head Z scanner range: 15 μm, (optional 30 μm)

Electronics

ADC: 18 channels 24-bit ADCs for X, Y, and Z scanner position sensor
DAC: 17 channels 20-bit DACs for X, Y, and Z scanner positioning 3 channels of integrated lock-in amplifier Spring constant calibration (Thermal vibration method) Digital Q control

AFM/SPM Modes

Basic modes: True Non-contact™ mode, Tapping mode, and Phase imaging, Contact mode and LFM, PinPoint™ imaging, F/D spectroscopy, Force volume imaging, MFM, Enhanced EFM (Basic EFM, DC-EFM, PFM, and SKPM), FMM, Nanoindentation NX option modes: C-AFM Options (Basic C-AFM, ULCA, VECA, SSRM), High Voltage option, SCM, SThM, STM

Vision (AFM)

The direct on-axis vision of sample surface and cantilever  Field-of-view: 840 μm × 630 μm (with 10× objective lens) Camera: 5 M Pixel (default), 1 M Pixel (optional)
Objective lens 10x (N. A. 0.21) ultra-long working distance lens 20x (N. A. 0.42) high-resolution, long working distance lens

Software - Park SmartScan™

• AFM system control and data acquisition software • Auto mode for quick setup and easy imaging • Manual mode for advanced use and finer scan control

Software - XEI

• AFM data analysis software • Stand-alone design—can install and analyze data away from AFM • Capable of producing 3D renders of acquired data

Inverted Optical Microscopy

Objective lens: up to 100x Fluorescence microscopy* (optional) Confocal microscopy* (optional)

GloveBox (Optional)

• Allows precise control over the humidity • Makeup of specified gaseous environments • Allowing you to insulate highly reactive materials

Dimensions in mm

NX12 Dimensions