Park- FX40-Atomic Force Microscope

Effortlessly, get the sharpest, clearest, highest resolution images and measurements one sample after another on various applications. Boost your progress and scientific discoveries through unprecedented speed and accuracy – as the Park FX40 autonomously images and acquires data powered by its artificial intelligence, robotics and machine learning capability. The Additional axis cameras automatically align with laser beams and photodetectors. The early warning systems and fail-safes at every step of the way allow you to focus on your research and not the tool.

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Description

Get Smarter with Machine Learning​​

Park FX40 uses machine learning to automatically detect whether probes are correctly positioned. Smart vision takes it one step further by locating the position of a loaded probe to a nano level and generating error status reports if necessary, instantly comparing this data to tens of thousands of possible simulated issues which are continuously upgraded through software updates.​

The True Non-contact mode achieves unprecedented control over tip-sample distance at the sub-nanometer scale. The Park FX40 has a faster and more accurate True Non-contact mode than any other AFM on the market.

Park-System Microscopic Solution

  • Auto Probe Exchange

    With automated probe exchange, you can now replace old probes easily and safely in full automation. Harnessing the convenience of an 8-probe cassette, along with a magnetic controlled mechanism, the Park FX40 autonomously mounts the probes.

  • Auto Probe Reading

    The Probe Identification Camera reads the QR code imprinted on the chip carrier of a newly loaded probe and extracts and displays all pertinent information on each of the tips available, including the type, model, application, and usage. This enables you to quickly select the best probe tip for each job.

  • Auto Beam Alignment

    Automatic Beam Alignment positions the laser beam onto the proper location of a cantilever and further optimizes the PSPD position both vertically and laterally. It shifts the X,Y and Z axis for clearer images, with no distortion, all autonomously at the click of a button.

Safety probe landing – Maximizing to protect your sampleNew tip crash prevention protects the tip and AFM scanner using a combination of software interlock and hardware switch. Through algorithmic programming, the Z stage can’t physically go down any further than the limit of tip collision with the sample surface, allowing you peace of mind for the safety of your sample and AFM.

Environmental SensorsSmartScan displays and stores measurements from sensors, which measure essential environmental conditions such as temperature, humidity, leveling and vibration. This allows you to compare your scanned images with different environmental channels, providing further environmental indicators for system diagnosis.
Safety Probe PickupBuilt-in robotics and a machine-learning algorithm detect and warn you about incorrectly placed probes, since you can use either the automatic or manual tip loading feature. Access various error status report during probe loading to make sure you have the highest degree of accuracy.

Setup,

Auto Setting

It does all your setup including the probe change, and laser alignment for imaging.

Position,

Sample Navigation

It performs a frequency a sweep for the cantilever, and approaches the Z-stage to the sample, all automatically. Park FX40 with its added sample camera, it facilitates you to navigate for scanning to your area of interest, effortlessly.

Image!

Dynamic Scanning

The system sets all the necessary parameters for optimum scanning, then engages the cantilever and starts scanning the sample. It continues to scan until the image is acquired and completed with best results.

XY Scanner Structure ▪ Single-module, parallel-kinematic 2D flexure scanner ▪ Better symmetry than serial-kinematic flexure scanner XY scan range ▪ 100 µm x 100 µm
Z Scanner Structure ▪ Flexure-guided high-force scanner ▪ Better symmetry than serial-kinematic flexure scanner Z scan range ▪ 15 µm
Sample mount Mounting ▪ Magnetic holder (Max. 4 sample disc) ▪ FX Snap-in Sample Disk for Multi Snap-in Sample Chuck
Stages Z stage travel range ▪ 22 mm (Motorized)
Visions and optics Vision path ▪ On-axis sample view from top ▪ The same view as an optical microscope CCD ▪ 5.1 M Pixel ▪ Pixel size: 3.45 μm x 3.45 μm
AFM Controller Lock-in amp ▪ 4 channels integrated DC - 5 MHz Accessories Probe exchange ▪ Probe exchange in less than 1 minutes using Automated Probe Exchange (No need to remove head to exchange cantilevers) Probe mount ▪ Pre-aligned mount using chip carrier

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