Particle Size Analyzer

The LS 13 320 XR boosts laser diffraction particle size analysis to the next level, with its enhanced PIDS technology and extended measurement range providing higher resolution and more accurate, reproducible results. You can measure a wider range of particles and detect smaller differences in samples more quickly and reliably. And new software with an intuitive interface provides data you need with only a few clicks.

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Description

For big improvements that help you spot small differences.

The LS 13 320 XR offers best-in-class particle size distribution data from advanced PIDS technology,* which enables high-resolution measurements and an expanded dynamic range. Like the LS 13 320, the XR particle size analyzer provides fast, accurate results, and helps you streamline workflows to optimize efficiency. Some big improvements help you reliably spot small differences that can have a huge impact on your particle analysis data.

  • Direct measurement range from 10 nm – 3,500 µm
  • Automatically highlights pass/fail results for faster quality control
  • Enhanced software that simplifies method creation for standardized measurements
  • New control standards to adequately verify instrument/module performance

Details matter. Minuscule changes in your sample material can result in big differences in a finished product. That´s why the LS 13 320 XR laser diffraction particle size distribution analyzer uses 132 detectors to provide higher resolution for more accurate results, together with an expanded measurement range from 10 nm – 3,500 μm.

Beckman-Coulter Life Science Solution

  • Expanded measurement range: 10 nm – 3,500 μm- Provides real (not extrapolated) analytical data down to 10 nm, and high-resolution measurements up to 3,500 μm
  • Enhanced PIDS technology: Polarization Intensity Differential Scattering- Enables more precise raw data detection and increased detector sensitivity of vertical and horizontal polarized scattered light for sub-μm particle size analysis – a measurement quality previously unavailable
  • Advanced auto modality- No knowledge about particle size distribution (e.g., multiple fractions, narrow distribution) needed prior to measurement in order to obtain a correct result
  • Optimized, intuitive software
  • Requires 2 clicks from Start Measurement to result
  • Includes an integrated optical constants database
  • Helpful user diagnostics keep you informed
  • Streamlines workflows to save time
  • Validation- This is a must for Good Manufacturing Practices and other regulatory requirements.
Therefore the LS 13 320 XR analyzer supports GMP with specific tools for Installation Qualification (IQ) and Operational Qualification (OQ).

  • Technology- Low-angle forward light scattering with additional PIDS (Polarization Intensity Differential Scattering) Technology. Analysis of vertical and horizontal polarized light at six different angles using three additional wavelengths. Full implementation of both Fraunhofer and Mie Theories.
  • Light source- Diffraction: Laser diode (785 nm)
PIDS: Tungsten lamp with high-quality band-pass filters (475, 613 and 900 nm)
  • Particle size analysis range- Measurement range: 10 nm – 3,500 μm
  • Dry Powder System Module (DPS): 400 nm - 3,500 μm
  • Universal Liquid Module (ULM): 10 nm - 2,000 μm
  • Electrical interface: USB
  • Power consumption: ≤ 6 amps @ 90 - 125 VAC
≤ 3 amps @ 220 - 240 VAC
  • Temperature range: 10 - 40°C (50 – 104°F)
  • Humidity: 0 - 90% without condensation
  • Compliance Creates: 21 CFR Part 11 enabling features
RoHS Certifications: - EU EMC Directive 2014/30/EU - CISPR 11:2009/A1:2010 - Australia and New Zealand RCM Mark
  • Data export file formats XLSX, TSV, PDF
  • File import capability From all LS 13 320 Legacy and LS 13 320 XR systems
  • Dimensions Height: 19.5” (49.53 cm)
Width: 37” (93.98 cm) Depth: 10” (25.4 cm) Weight 52 lbs (23.5 kg)

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