Malvern Panalytical Zetium WD-XRF

X-ray fluorescence spectrometry (XRF) is capable of elemental analysis of a wide range of materials, including solids, liquids and loose powders. Designed to meet the most demanding process control and R&D applications, the Zetium spectrometer leads the market in high-quality design and innovative features for sub ppm to percentage analysis of Be to Am.

Building on years of experience and success with our extensive analytical X-ray portfolio, Zetium represents a revolutionary step in materials analysis. The platform embodies SumXcore technology – an integration of WDXRF, EDXRF and XRD. This unique combination of possibilities puts Zetium in a class of its own with respect to analytical power, speed and task flexibility in multiple environments.

Dedicated industry editions of the Zetium XRF spectrometer are offered for specific industries: cement, minerals, metals, petrochemicals and polymers & plastics. The Ultimate edition configuration meets the most demanding requirements regardless of industry.

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Description

Elemental innovation

Continuous development, improved customer experience 

Scientifically-sound, benefits-driven innovations achieved with SumXcore technology – an integration of WDXRF and EDXRF – incorporated into the Zetium platform provide ultimate flexibility, performance and versatility and are on track to revolutionize the world of XRF.

Elemental innovation

Elemental intelligence

Advanced analytical hardware requires advanced analytical software and expertise 

A quantum step for our renowned SuperQ software gives access to new technology combinations and analytical possibilities. Starring the Virtual Analyst, it enhances the user experience in setting up and operating the system.

Elemental intelligence

Elemental support

Transparent and reliable support no matter the location

From service to expertise, training to laboratory analysis the user is supported from every angle. With a worldwide network of experienced engineers, coupled with the industry’s largest pool of application scientists, Malvern Panalytical is always on hand to help you meet your analytical requirements.

Elemental support

Elemental technology

60 years of experience and heritage – the ideal starting point

Zetium is the next in a generation of remarkably successful WDXRF spectrometers, including the Axios, the MagiX and the PW2400. This heritage of proven technology has been refined and brought forward providing the foundation to the Zetium platform.

Elemental technology

Smart Manager

Unleash the potential of your data

Until now, instrument data has too often been stuck in manual records, spreadsheets or site-specific servers. By connecting the Zetium to our Smart Manager and continually analyzing instrument data in the cloud, you can unleash its full potential. This is just one of our digital solutions that are part of Malvern Panalytical’s Connected World.

Unleash the potential of your data

Malvern-Panalytical X-Ray Machine

Enhanced analytical performance

  • Power upgrades from 1 to 2.4, 3 or 4 kW for enhanced sensitivity
  • Range of X-ray tube anode materials Rh, Cr, Mo and Au for specific application performance
  • Duplex detector for enhanced sensitivity and wider dynamic range for transition metals analysis
  • HiPer scintillation detector for increased dynamic range for heavy elements (linear up to 3.5 Mcps) ideal for high precision analysis of Nb and Mo in steels

Superior user experience

  • Simple, intuitive software with The Virtual Analyst
  • Full suite of application setup modules and software solutions
  • Industry-leading standardless XRF analysis with Omnian – analysis of unknowns or when standards are unavailable
  • Multi-element small spot analysis with mapping
  • Programmable collimator masks for sample sizes between 6 mm and 37 mm

Maximum sample throughput

  • SumXcore technology – measurement times reduced by up to 50% with an ED core
  • Power upgrades from 1 to 2.4, 3 or 4 kW for faster analysis times
  • Hi-Per channels for simultaneous measurement of light elements
  • Continuous and direct sample loading significantly reduces instrument overhead
  • High-capacity sample changer bed (up to 209 positions) for high throughput applications
  • Sample changer bar code reader option enables fast, error-free sample loading and data entry

Robustness

  • Dust removal device minimizes contamination and maximizes instrument uptime
  • CHI-BLUE X-ray tube window coating for increased X-ray tube durability and resistance to corrosion
  • Sample type identification (solids & liquids)
  • Bar code reader for error-free sample entry

 Low cost of ownership

  • Space-saving, compact design
  • Small-volume airlock design – for rapid cycling of samples into vacuum, or low He consumption for liquids analysis
  • Easy-access service modules mean faster instrument serviceability and minimum downtime
  • Dedicated chiller removes heat from the laboratory – avoiding overtaxing laboratory air conditioning infrastructure
  • Packaged cost-saving solutions

Enhanced data security

The Enhanced Data Security option for the SuperQ software package helps you strengthen your audit trail, minimize the risk of error, and prove that your XRF instrument is working as expected. Capabilities include advanced user management, action logging, data protection and application status assignment.

Basic configuration highlights Performance upgrades Benefits
Pre-calibration of Omnian package Analysis of a wide variety of sample materials including rocks, ores, metals, plastics and oils
Applications of choice Unique pre-calibration modules or calibration sets to enable accurate elemental analysis of a wide range of sample types, ideal for the metal manufacturer, from process to quality control
No-drift SST R-mAX 4 kW X-ray tube, 50 micron window Maximum uptime for consistent process control combined with ultra-light element enhancement and durability
Curved crystals Up to 30% more intensity in the same measurement time Shorter measurement time to achieve required limits
Duplex detector Enhanced sensitivity and wider dynamic range for transition metals analysis
Hi-Per scint Increased dynamic range for heavy elements (linear up to 3.5 Mcps) High-precision analysis of Nb and Mo in steels
SumXcore Faster results in tandem with the WD functionality and possibility to detect unexpected changes in composition
Small spot mapping Unique compositional mapping functionality attached to the ED screening, for fast and accurate determination of compositional trends and heterogeneities

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