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Epsilon 3XLE

Epsilon 3XLE is a benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer that is used for elemental analysis from carbon (C) to americium (Am) in areas from R&D through to process control. Easy to operate, reliable and highly flexible, it is ideally suited to a broad range of industries and applications. The instrument is powered by the latest advances in excitation and detection technology, delivering excellent analytical performance. The SDDUltra silicon drift detector fitted in Epsilon 3XLE enables ultra light element analysis of even carbon, nitrogen and oxygen.

Outperforming your expectations

  • X-ray safety assured
  • High sensitivity through smart excitation and detection technology
  • Outstanding analytical performance with extending ultra-light elements (C – Am)
  • Omnian (semi-quantitative), FingerPrinting, Stratos (multi-layer analysis), Oli-Trace and regulatory compliance modules

New developments

Epsilon 3XLE instruments combine the latest excitation and detection technology with state-of-the-art analysis software. The 15 Watt x-ray tube in combination with the high current (3 mA), latest silicon drift detector SDDUltra together with the compact design of the optical path, delivers even better analytical performance than 50 Watt power EDXRF and even benchtop WDXRF systems – with the added bonus of power efficiency. The SDDUltra silicon drift detector fitted in Epsilon 3XLE enables ultra light element analysis of even carbon, nitrogen and oxygen.

PANalytical XRF benchtop spectrometers, history

Compliance readiness

The Epsilon 3XLE conforms to the requirements of international standards such as ASTM, ISO and DIN and is supported by PANalytical’s worldwide network of sales and service specialists. It is a cost–effective and viable alternative to conventional systems for a wide variety of industries and applications, includ

Epsilon 3XLE

Energy dispersive X-ray fluorescence spectrometer for the elemental analysis range from carbon (C) to americium (Am) and the concentration range from sub-ppm to 100%. Use Omnian for semi-quantifcation, use FingerPrint for material testing when analysis speed is important or use Stratos for a rapid, simple and non-destructive analysis of coatings, surface layers and multi-layered structures. One could also use Enhanced Data Securitywhich supports compliancy to regulations like FDA 21 CFR Part 11 or use Oil-Trace for quantifying fuel-biofuel mixtures to new and used lubricating oils.