Advanced wavelength dispersive XRF analysis
The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, PANalytical’s 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm. Read more »
Multi-element chemical composition analysis in seconds
Do you need non-destructive analysis of chemical composition in seconds because of time-critical process control or running sample high-throughputs? With up to 28 elements measured simultaneously in concentration ranges from ppm to 100%, the PANalytical Axios FAST simultaneous WDXRF spectrometer is the ideal solution. Accurate and robust analysis, ease of operation by less-experienced staff and high uptime go hand in hand with a lo Read more »
Small and powerful
The Epsilon 1 is a fully integrated energy dispersive XRF analyzer consisting of a spectrometer, built-in computer, touch screen and analysis software. Powered by the latest advances in excitation and detection technology the Epsilon 1 is a star performer in the low-cost benchtop instrument class.
Epsilon 1 produces fast, cost-effective, precise and accurate data with minimal operator dependence and sample preparation. The total running cost is therefore much lowe Read more »
High-performance benchtop spectrometry
Epsilon 3X is a benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer that is used for elemental analysis in areas from R&D through to process control. Easy to operate, reliable and highly flexible, it is ideally suited to a broad range of industries and applications. The performance of the instrument is increased through 50 kV excitation capabilities, delivering excellent analytical performance. Read more »
Flexible and safe automation for process control
Historically, the automation of X-ray fluorescence (XRF) instruments has been limited to high-power wavelength dispersive (WD) XRF systems. However, more and more benchtop energy dispersive (ED) XRF spectrometers are sold into production control as cost-effective solutions because of improved performance. Recent advances in Epsilon 3X (ED)XRF spectrometers make them an attractive alternative in Read more »
Epsilon 3XLE is a benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer that is used for elemental analysis from carbon (C) to americium (Am) in areas from R&D through to process control. Easy to operate, reliable and highly flexible, it is ideally suited to a broad range of industries and applications. The instrument is powered by the latest advances in excitation and detection technology, delivering excellent analytical performance. The SDDUltra silicon d Read more »
X-ray fluorescence spectrometry (XRF) is capable of elemental analysis of a wide range of materials, including solids, liquids and loose powders. Designed to meet the most demanding process control and R&D applications, the Zetium spectrometer leads the market in high-quality design and innovative features for sub ppm to percentage analysis of Be to Am.
Building on years of experience and success with our extensive analytical X-ray portfolio, Zetium represents a revolutionary step in mat Read more »
OMC is an ISO 9001:2008 Quality Management Systems accredited company.